NANO-PATTERNING METHOD USING ATOMIC FORCE MICROSCOPE BASED ON VOLTAGE PROGRAMMING,申请号KR20040045942-传众专利搜索

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发明名称	NANO-PATTERNING METHOD USING ATOMIC FORCE MICROSCOPE BASED ON VOLTAGE PROGRAMMING
摘要
申请公布号	KR20050120842(A)	申请公布日期	2005.12.26
申请号	KR20040045942	申请日期	2004.06.21
申请人	SEOUL NATIONAL UNIVERSITY INDUSTRY FOUNDATION	发明人	LEE, JONG HEOP;KIM, YOUNG HUN;CHOI, IN HEE
分类号	B82B3/00;G01Q60/24	主分类号	B82B3/00
代理机构		代理人
主权项
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