发明名称 CMOS transistor with dual high-k gate dielectric and method of manufacture thereof
摘要 A CMOS device with transistors having different gate dielectric materials and a method of manufacture thereof. A CMOS device is formed on a workpiece having a first region and a second region. A first gate dielectric material is deposited over the second region. A first gate material is deposited over the first gate dielectric material. A second gate dielectric material comprising a different material than the first gate dielectric material is deposited over the first region of the workpiece. A second gate material is deposited over the second gate dielectric material. The first gate material, the first gate dielectric material, the second gate material, and the second gate dielectric material are then patterned to form a CMOS device having a symmetric V<SUB>t </SUB>for the PMOS and NMOS FETs.
申请公布号 US2005280104(A1) 申请公布日期 2005.12.22
申请号 US20040870616 申请日期 2004.06.17
申请人 LI HONG-JYH 发明人 LI HONG-JYH
分类号 H01L21/02;H01L21/28;H01L21/336;H01L21/8234;H01L21/8238;H01L27/092;H01L29/49;H01L29/51;H01L29/76;(IPC1-7):H01L29/76 主分类号 H01L21/02
代理机构 代理人
主权项
地址