发明名称 INSULATED GATE-TYPE SEMICONDUCTOR DEVICE AND ITS MANUFACTURING METHOD
摘要 PROBLEM TO BE SOLVED: To provide an insulated gate-type semiconductor device which has a quick off-speed and carries out a good performance, and to provide a method of manufacturing the semiconductor device. SOLUTION: The insulated gate-type semiconductor device comprises an n<SP>-</SP>-type base region 11, a p<SP>+</SP>-type collector region 12, a p-type base region 13, and an n<SP>+</SP>-type emitter region 14, on the lower surface of the n<SP>-</SP>-type base region 11. There are formed an n<SP>+</SP>-type collector short region 15 extending to the n<SP>-</SP>-type base region 11 side rather than the p<SP>+</SP>collector region 12, and p<SP>+</SP>-type semiconductor region 16 at an interface between the n<SP>+</SP>-type collector short region 15 and the n<SP>-</SP>-type base region 11. COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP2005354008(A) 申请公布日期 2005.12.22
申请号 JP20040176019 申请日期 2004.06.14
申请人 SANKEN ELECTRIC CO LTD 发明人 KONO YOSHINOBU
分类号 H01L21/28;H01L21/336;H01L29/08;H01L29/417;H01L29/739;H01L29/78;(IPC1-7):H01L29/78 主分类号 H01L21/28
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