| 摘要 |
PROBLEM TO BE SOLVED: To provide a scanning laser microscope and a detection wavelength range setting method capable of setting easily the optimum detection wavelength range (start wavelength and acquired wavelength width) for an observation object. SOLUTION: A spectral line direction slit width of a slit 27 is set within a standard detection wavelength range A of a reagent that is the observation object, by a control unit 29, a data is acquired by a photomultiplier 28, the spectral line direction slit width of the slit 27 is set thereafter within a prescribed wavelength range X sufficiently narrower than the standard detection wavelength range A, and a data is acquired while controlling a reflection angle of a diffraction grating galvanomirror 25 to be scanned with shifts of several steps using the wavelength range X as a wavelength width unit. Addition and subtraction are carried out to/from the standard detection wavelength range A, using the data acquired by the shifting scan, the periphery of the standard detection wavelength range A is data-interpolated uniformly while shifting the detection start wavelength and the acquired wavelength width, a plurality of interpolated data is generated therein, and the optimum detection wavelength range (start wavelength and acquired wavelength width) is set on the basis of the data. COPYRIGHT: (C)2006,JPO&NCIPI
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