| 摘要 |
PROBLEM TO BE SOLVED: To provide a semiconductor memory device, a fuse box circuit, and a semiconductor integrated circuit, by which the number of fuses in a fuse circuit is reduced and a control circuit is eliminated. SOLUTION: The semiconductormemory device is configured so that a memory coincidence circuit discriminates whether or not memory information set to each semiconductor memory device is matched with external memory information. When they are matched with each other, a repair discrimination circuit discriminates whether or not an access address for making access to 1st memory coincides with a repair address for indicating a defective cell of the 1st cell, and when they are matched, it makes access to a 2nd memory. In this configuration of the memory, the fuse box circuit 1 for repair can be used in common. COPYRIGHT: (C)2006,JPO&NCIPI
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