发明名称 |
Low-pressure chamber for scanning electron microscopy in a wet environment |
摘要 |
A specimen enclosure assembly ( 100 ) for use in an electron microscope and including a rigid specimen enclosure dish ( 102 ) having an aperture ( 122 ) and defining an enclosed specimen placement volume ( 125 ), at electron beam permeable, fluid impermeable, cover ( 114 ) sealing the specimen placement volume ( 125 ) at the aperture ( 122 ) from a volume outside the enclosure and a pressure controller communicating with the enclosed specimen placement volume ( 125 ) and being operative to maintain the enclosed specimen placement volume ( 125 ) at a pressure, which exceeds a vapor pressure of a liquid sample ( 123 ) in the specimen placement volume ( 125 ) and is greater than a pressure of a volume outside the enclosure, whereby a pressure differential across the cover ( 114 ) does not exceed a threshold level at which rupture of the cover ( 114 ) would occur
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申请公布号 |
US2005279938(A1) |
申请公布日期 |
2005.12.22 |
申请号 |
US20040516407 |
申请日期 |
2004.12.02 |
申请人 |
YEDA RESEARCH AND DEVELOPMENT CO. LTD. |
发明人 |
MOSES ELISHA;THIBERGE STEPHAN Y. |
分类号 |
G01N23/225;G01N23/00;G02B;G21K7/00;H01J37/00;H01J37/20;H01J37/252;H01J37/26;(IPC1-7):G21K7/00 |
主分类号 |
G01N23/225 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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