| 摘要 |
PROBLEM TO BE SOLVED: To provide an omnidirectional flaw detection probe capable of executing flaw detection inspection of a defect in a wide area of a specimen, in a short time, by the single probe. SOLUTION: This omnidirectional flaw detection probe related to the present invention is provided with a plurality of oscillators arranged on a three-dimensional curved face to form a phased array. The omnidirectional flaw detection probe related to the present invention allows thereby at once the execution of the flaw detection inspection in the area of 360°along a circumferential direction of a normal, and of 0-90°as an angle formed with respect to the normal, as to the normal on an opposed face of the specimen. COPYRIGHT: (C)2006,JPO&NCIPI
|
