发明名称 SEMICONDUCTOR STORAGE
摘要 <p>Disclosed is a semiconductor storage which operates stably and can be produced by an MOS process. A storage transistor (STr) comprises impurity diffused regions (22, 24), a channel forming region (23a), a charge storage node (23b), a gate oxide film (18) and a gate electrode (19). The gate electrode (19) is connected to a gate line (GL), and the impurity diffused region (24) is connected to a source line (SL). The storage transistor (STr) stores data "1" or data "0" by creating a state where holes are stored in the charge storage node (23b) or a state where holes are not stored in the charge storage node (23b). An access transistor (ATr) comprises impurity diffused regions (20, 22), a channel forming region (21), a gate oxide film (16) and a gate electrode (17). The impurity diffused region (20) is connected to a bit line (BL).</p>
申请公布号 WO2005122244(A1) 申请公布日期 2005.12.22
申请号 WO2005JP10242 申请日期 2005.06.03
申请人 RENESAS TECHNOLOGY CORP.;MORISHITA, FUKASHI;ARIMOTO, KAZUTAMI 发明人 MORISHITA, FUKASHI;ARIMOTO, KAZUTAMI
分类号 G11C11/405;H01L21/8242;H01L27/108;(IPC1-7):H01L21/824 主分类号 G11C11/405
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