发明名称 2-BEAM SCANNER, 2-BEAM DETECTING METHOD THEREFORE, MULTI-BEAM SCANNER AND MULTI-BEAM DETECTING METHOD THEREFORE
摘要 PROBLEM TO BE SOLVED: To separately detect two lines of luminous flux to a scanning area in a 2-beam scanner. SOLUTION: In the 2-beam scanner, luminous fluxes from two independent semiconductor lasers are turned into circularly polarized light having reverse directions to each other with a common 1/4 wavelength plate, and deflected by reflecting on the deflection and reflection face of a common optical deflector, the respective deflected luminous fluxes are converged as two light spots on a face to be scanned with a scanning and image-forming optical system, and two scanning lines are simultaneously scanned. The 2-beam detecting method is characterized in that two luminous fluxes directed to the scanning area are separated and detected, two luminous fluxes directed to the scanning area are made incident on a polarized light beam splitter via a common 1/4 wavelength plate, the respective luminous fluxes are spatially separated from each other and the respective separated luminous fluxes are made incident on light receiving elements corresponding to each of them and detected. COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP2005352517(A) 申请公布日期 2005.12.22
申请号 JP20050235018 申请日期 2005.08.12
申请人 RICOH CO LTD 发明人 SUHARA HIROYUKI
分类号 B41J2/44;G02B26/10;(IPC1-7):G02B26/10 主分类号 B41J2/44
代理机构 代理人
主权项
地址