GENERATING DEVICE, GENERATING METHOD, PROGRAM AND RECORDING MEDIUM

摘要

A generating device and the like for generating a test program or a test pattern program to be executed in a semiconductor test apparatus by using intermediate data. A generating method for advanced automatic generation by specifying a part which can be automated, a program for executing the generating method by computer, a recording medium wherein the program is recorded, and the generating device which simplifies the system configuration are provided. The generating device (51) is provided with an intermediate data generating engine (53), which generates intermediate data from a timing set for each of a plurality of pins provided in a device to be tested, and waveform mode or pattern data, based on a vector file generated by logical simulation and the like of the device to be tested by the semiconductor test apparatus.