发明名称 METHOD AND DEVICE FOR TESTING LIGHT RESISTANCE
摘要 PROBLEM TO BE SOLVED: To efficiently conduct a test by an inexpensive facility, and to quickly obtain a test result, when testing a light resistance of an optical component for coping with a specified short wavelength light source. SOLUTION: Light beams emitted from respective light sources are brought once into parallel light beams by respective collimator lenses, using a plurality of the laser beam sources having a wavelength band used for optical pick-up for blue laser or the like, and the parallel light beams are associated thereafter by the second collimator lens of a relatively long focal distance and long diameter, to be convergence-emitted toward the optical component serving as a tested component. The plurality of the laser beam sources and the plurality of collimator lenses enhance light density by arranging those two-dimensionally in parallel. A wavelength as same to one in actual use as possible is used as a wavelength of the light source. COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP2005351726(A) 申请公布日期 2005.12.22
申请号 JP20040172082 申请日期 2004.06.10
申请人 SONY CORP 发明人 MITSUI SADAJI
分类号 G01N17/00;G01M11/00;(IPC1-7):G01N17/00 主分类号 G01N17/00
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