| 摘要 |
<P>PROBLEM TO BE SOLVED: To provided a hub, memory module, memory system and reading method and writing method through the memory system. <P>SOLUTION: In the hub, memory module, memory system and reading method and writing method, test writing and test reading can be carried out on all the memory modules, memory devices and memory units by bypassing identification information on the memory modules, memory devices and memory units in a test mode. Testing time can be reduced because simultaneous reading and writing on all the memory modules, memory devices and memory units can be carried out by bypassing the memory identification information. <P>COPYRIGHT: (C)2006,JPO&NCIPI |
