METHOD FOR TESTING MEMORY MODULE IN TRANSPARENT TRANSMISSION MODE AND HUB OF MEMORY MODULE FOR EXECUTING TEST

摘要

PROBLEM TO BE SOLVED: To provide a circuit for testing a memory module which can detect failures in the memory module through received data by switching a mode of the memory module into a transparent transmission mode, and a method thereof. SOLUTION: In switching into the transparent transmission mode, I/O data pins of the memory module for resolving mismatching number of pins which a tab of the memory module has are composed of input pins. Thus, the problem of mismatching number of pins which occurs in a transparent transmission mode test of the memory module is solved. COPYRIGHT: (C)2006,JPO&NCIPI