发明名称 Method for manufacturing semiconductor substrate and semiconductor substrate
摘要 A method for manufacturing a semiconductor substrate comprises the steps of: forming a gate oxide film as an insulating layer on the surface of a semiconductor substrate; implanting boron ions for inhibiting the migration of a peeling substance in the semiconductor substrate to form an anti-diffusion layer in the semiconductor substrate; activating boron in the anti-diffusion layer by heat treatment; implanting hydrogen ions into the semiconductor substrate to form a peel layer in part of the semiconductor substrate at a side of the anti-diffusion layer opposite to the gate oxide film; bonding a glass substrate to the surface of the semiconductor substrate where the gate oxide film has been formed; and heat-treating the semiconductor substrate to separate part of the semiconductor substrate along the peel layer.
申请公布号 US2005282019(A1) 申请公布日期 2005.12.22
申请号 US20050147359 申请日期 2005.06.08
申请人 SHARP KABUSHIKI KAISHA 发明人 FUKUSHIMA YASUMORI;TAKAFUJI YUTAKA
分类号 B32B9/04;H01L21/68;(IPC1-7):B32B9/04 主分类号 B32B9/04
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