发明名称 Substrate handling device for a charged particle beam system
摘要 An electron beam lithography system includes a main chamber (4) and the exchange chamber (5) connected by a gate valve (7). A robot (15) is used to transfer a chuck (8) carrying a semiconductor wafer between a cassette (10) and laser interferometer mirror assembly (13). The robot includes a bar (17) and a side member (18) extending laterally from the bar for supporting the chuck.
申请公布号 GB2415291(A) 申请公布日期 2005.12.21
申请号 GB20040013357 申请日期 2004.06.15
申请人 * NANOBEAM LIMITED 发明人 TAO * ZHANG
分类号 H01L21/677 主分类号 H01L21/677
代理机构 代理人
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