发明名称 TEST APPARATUS
摘要 <p>A test apparatus for testing an electronic device, includes a test module for sending and/or receiving a test signal to and/or from the electronic device, a test head including a plurality of TH slots for detachably holding the test module, a diagnosis module for performing diagnosis of the test module, and coupling means including a plurality of PB slots being electrically coupled to the TH slots respectively for detachably holding the diagnosis module. The diagnosis module held in one of the PB slots diagnoses the test module held in one of the TH slots being electrically coupled to the one the PB slots. &lt;IMAGE&gt;</p>
申请公布号 EP1607758(A1) 申请公布日期 2005.12.21
申请号 EP20040721691 申请日期 2004.03.18
申请人 ADVANTEST CORPORATION 发明人 SHIBUYA, ATSUNORI
分类号 G01R31/28;G01R31/319;G01R35/00;(IPC1-7):G01R31/318 主分类号 G01R31/28
代理机构 代理人
主权项
地址