发明名称 Titanium silicate films with high dielectric constant
摘要 <p>A method of making a film with a high dielectric constant uses a spin-on sol-gel process to deposit the film on a substrate, the film having a composition (SiO 2 ) x (TiO 2 ) 1-x , where 0.50 &lt; x &lt; 0.75. The resulting film is annealed in an oxygen-containing atmosphere at a temperature lying in the range of 500°C to 700°C.</p>
申请公布号 EP1607375(A2) 申请公布日期 2005.12.21
申请号 EP20050104951 申请日期 2005.06.07
申请人 DALSA SEMICONDUCTOR INC. 发明人 MY ALI, EL KHAKANI;DILIP K., SARKAR;OUELLET, LUC;BRASSARD, DANIEL
分类号 C03C1/00;C03C3/076;C03C4/16;C03C17/25;C23C18/12;(IPC1-7):C03C1/00 主分类号 C03C1/00
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