发明名称 |
METHOD FOR FORMING A SEMICONDUCTOR DEVICE HAVING A SILICIDE LAYER |
摘要 |
<p>A method for forming a semiconductor device includes providing a semiconductor substrate, forming an insulating layer over the semiconductor substrate, forming a conductive layer over the insulating layer, forming a first metal silicide layer over the conductive layer, , patterning the conductive layer to form a patterned first layer, wherein the patterned first layer is a part of a control electrode, patterning the first metal silicide layer to form a patterned first metal silicide layer over the control electrode so that the patterned first metal silicide layer remains over the control electrode, and forming a second metal silicide over the patterned metal silicide layer, wherein the second metal silicide layer has a thickness greater than the thickness of first metal silicide layer.</p> |
申请公布号 |
WO2005119752(A1) |
申请公布日期 |
2005.12.15 |
申请号 |
WO2005US14324 |
申请日期 |
2005.04.26 |
申请人 |
STEPHENS, TAB A.;FREESCALE SEMICONDUCTOR, INC.;JAWARANI, DHARMESH |
发明人 |
JAWARANI, DHARMESH;STEPHENS, TAB A. |
分类号 |
H01L21/28;H01L21/285;H01L21/3205;H01L21/3215;H01L21/336;H01L21/4763;H01L29/76;(IPC1-7):H01L21/320 |
主分类号 |
H01L21/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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