发明名称 |
MICRO-SAMPLE PREPARATION DEVICE, MICRO-SAMPLE INSTALLATION TOOL, AND MICRO-SAMPLE PROCESSING METHOD |
摘要 |
PROBLEM TO BE SOLVED: To enable sample preparation capable of shortening a time for preparing a micro-sample, having high reliability at the EDX analysis time, and having a clean processing surface competent for high power observation, concerning a sample preparation device enabling analysis or observation of a micro-region by extracting a fine sample from a parent sample by utilizing FIB. SOLUTION: This micro-sample installation tool 1a, 1b for fixing the micro-sample in the sample preparation device is made of a metal and has the mechanical strength by adjusting the thickness of the greater part to be 30-100μm, and a micro-sample fixing part 2a, 2b has a thin-walled structure having the thickness of 5μm or less and the height of 10μm or more. COPYRIGHT: (C)2006,JPO&NCIPI
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申请公布号 |
JP2005345347(A) |
申请公布日期 |
2005.12.15 |
申请号 |
JP20040167079 |
申请日期 |
2004.06.04 |
申请人 |
HITACHI HIGH-TECHNOLOGIES CORP |
发明人 |
UMEMURA KAORU;ONISHI TAKESHI;KONNO MITSURU |
分类号 |
G01N1/28;H01J37/20;(IPC1-7):G01N1/28 |
主分类号 |
G01N1/28 |
代理机构 |
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地址 |
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