发明名称 DISPLACEMENT MEASURING SYSTEM AND METHOD
摘要 PROBLEM TO BE SOLVED: To measure displacement in a structure, by performing measurement once later on, without acquiring the backward scattered light in real time, by always operating an expensive analyzer. SOLUTION: A plastic optical fiber 11 is laid in advance in the structure 21. The signal light is made incident from one end of this laid plastic optical fiber 11. The backward scattered signal light is detected in response to plastic deformation caused in the plastic optical fiber 11. A displacement position and its displacement quantity are also measured by an OTDR device 12 based on the chronological changing trend in the quantity of the detected signal light. COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP2005345376(A) 申请公布日期 2005.12.15
申请号 JP20040167529 申请日期 2004.06.04
申请人 RIKOGAKU SHINKOKAI 发明人 NAKAMURA KENTARO
分类号 G01B11/16;G01D5/26;G01D5/353;G01M11/00;(IPC1-7):G01B11/16 主分类号 G01B11/16
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