发明名称 MOS SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To make the action of a MOS semiconductor device with a surge protection diode stable by mounting the surge protection diode on the semiconductor substrate or in the substrate and by raising resistance to surge voltage. SOLUTION: The following things are important for this invention. An internal control circuit integrated in a self-isolation region or bonding isolation region that has been formed on the surface layer of the semiconductor substrate has a MOS semiconductor device. The distance between the channel region of the MOS semiconductor device and the channel region of the main MOS semiconductor device is set to be no less than 200μm. The amount of impurities of the self-isolation region or bonding isolation region is set to be 1×10<SP>13</SP>to 1×10<SP>14</SP>cm<SP>-2</SP>. The distance between an extraction electrode arranged in contact with the surface of the self-isolation region or bonding isolation region and the channel region of the MOS semiconductor device of the internal control circuit is no more than 100μm. COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP2005347771(A) 申请公布日期 2005.12.15
申请号 JP20050213578 申请日期 2005.07.25
申请人 FUJI ELECTRIC DEVICE TECHNOLOGY CO LTD 发明人 YOSHIDA KAZUHIKO;FUJIHIRA TATSUHIKO;KUDO MOTOI;FURUHATA SHOICHI;TAKEUCHI SHIGEYUKI
分类号 H01L27/04;H01L21/76;H01L21/822;H01L21/8234;H01L27/08;H01L27/088;H01L29/739;H01L29/78;(IPC1-7):H01L21/823 主分类号 H01L27/04
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