发明名称 VERY PRECISE RESISTANCE MEASUREMENT
摘要 A circuit and a related method to measure very precisely the resistance Rm of a small resistor independent from process and temperature variations. This resistor may be the R<SMALLCAPS>ON </SMALLCAPS>resistance of an external sensor or e.g. the resistance of a safety device as a squib. A constant current source provides a current I<SMALLCAPS>BIAS </SMALLCAPS>causing a voltage drop Vm at the resistor to be measured. Using a configuration of operational amplifiers and current mirrors, wherein one of the current mirrors has a gain of n, an output voltage V<SMALLCAPS>OUT </SMALLCAPS>is achieved, which is defined by V<SMALLCAPS>OUT</SMALLCAPS>=nxRmxI<SMALLCAPS>BIAS</SMALLCAPS>. The gain n of a current mirror allows a very precise measurement of the resistance Rm of the resistor to be measured. The output voltage is finally converted from analog to digital values.
申请公布号 US2005275413(A1) 申请公布日期 2005.12.15
申请号 US20040880404 申请日期 2004.06.29
申请人 DIALOG SEMICONDUCTOR GMBH 发明人 ARIGLIANO ANTONELLO
分类号 G01R27/02;G01R27/14;G01R31/02;(IPC1-7):G01R31/02 主分类号 G01R27/02
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