| 摘要 |
A sample collection container rack overlay comprising a top with apertures and identifying marks identifying the apertures and at least one projecting side is provided. The sample collection container overlay rack is adapted to fit sample collection container racks and provide ease of identification of sample collection containers present in the sample collection container racks. The apertures of the sample collection container rack may include any size adapted to receive sample collection containers. The at least one projecting side provides added stability to the sample collection container rack overlay. Additionally the at least one projecting side may include a knurled portion or a finger indentation for ease of placements and of removal of the rack overly from the rack.
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