发明名称 TEST BOARD LOCKING DEVICE INCLUDING STIFFENER
摘要 PROBLEM TO BE SOLVED: To provide a test board locking device including a stiffener. SOLUTION: The invention relates to the test board locking device for testing a semiconductor chip and more particularly relates to the test board locking device capable of easily mounting/detaching a test board on/from the stiffener in the EDS test process of the semiconductor chip. The test board locking device includes the stiffener 310 consisting of a plurality of fixing bars 316 disposed in a predetermined distance, first fixing holes 324 each corresponding to the bars 316, the test board 320 connected onto the stiffener 310 and second fixing holes 332 each corresponding to the bars 316 and is provided with a lid section 330 for connecting the board 320 to the stiffener 310. The bars 316 are positioned in the stiffener 310 and are protruded from the stiffener 310, when each of the bars 316 is rotated in one direction, the bars are elevated to the stiffener 310, and when they rotated in another direction, they are lowered to the stiffener 310. COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP2005347736(A) 申请公布日期 2005.12.15
申请号 JP20050130547 申请日期 2005.04.27
申请人 SAMSUNG ELECTRONICS CO LTD 发明人 JUN SEUNG-HOON
分类号 H01L21/66;G01R31/02;G01R31/28;(IPC1-7):H01L21/66 主分类号 H01L21/66
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