发明名称 BONDING OF POLISHING PAD, METHOD OF SEPARATION AND CHEMICAL MACHINERY POLISHING DEVICE
摘要 <P>PROBLEM TO BE SOLVED: To facilitate the bonding and separation of a polishing pad in a CMP (Chemical Machinery Polishing) device. <P>SOLUTION: The chemical machinery polishing device is equipped with a platen 1 with a polishing pad 5 bonded thereto, and a wafer retaining mechanism 7 for rotating the platen while retaining the wafer so as to be pushed against the polishing pad. In the polishing pad bonding method wherein the polishing pad 5 is bonded to the platen 1, the polishing pad 5 is transparent, and an adhesive for bonding the polishing pad 5 to the platen 1 is an ultraviolet ray curing type adhesive. <P>COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP2005347473(A) 申请公布日期 2005.12.15
申请号 JP20040164527 申请日期 2004.06.02
申请人 TOKYO SEIMITSU CO LTD 发明人 TSUCHISHIMA JIRO
分类号 B24B37/20;B24B37/24;H01L21/304 主分类号 B24B37/20
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