| 摘要 |
The integrated circuit ( 1 ) according to the invention comprises a set of cells ( 10 ), each of the cells 11, 13, 15, 19 ) comprises an electrical device ( 20 ) with a device parameter whose parameter value is a function of random parametric variations. The set of cells ( 10 ) comprises a first subset ( 12 ) of identification cells ( 13 ) with first random parametric variations, and a second subset ( 14 ) of cells ( 11, 15,19 ), which are able to generate an identification code by measuring the random differences between the parameter values of the identification cells ( 13 ). According to the invention the cells ( 11, 15, 19 ) of the second subset ( 14 ) have second random parametric variations, which are smaller than the first random parametric variations, thereby making the generation of the identification code relatively easy.
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