发明名称 OPHTHALMOLOGIC MEASURING APPARATUS
摘要 <P>PROBLEM TO BE SOLVED: To provide an ophthalmologic measuring apparatus which can quickly and simultaneously measure an optic axial length and a refraction power of the examined eye with a simple structure. <P>SOLUTION: The ophthalmologic measuring apparatus to measure the refraction power and the optic axial length of the examined eye without contacting includes a measuring light emitting optical system to irradiate the measuring light with a short coherent length to the examined eye, a light receiving optical system to receive the reflection light by the measuring light from the fundus of the examined eye, a refraction power measuring means to acquire the refraction power of the examined eye on the basis of a light receiving situation of the reflection light received by the light receiving optical system, an interference optical system which irradiates the examined eye with the light having a low coherence for the examined eye, makes the reflection light of the cornea of the examined eye obtained by the irradiation as the reference light, compounds the reference light and the reflection light from the fundus of the examined eye obtained by the measuring light emitting optical system to interfere each other and receives the interference light, and an optic axial length measuring means to measure the optic axial length of the examined eye on the basis of an interference signal obtained by the interference optical system. <P>COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP2005342204(A) 申请公布日期 2005.12.15
申请号 JP20040165372 申请日期 2004.06.03
申请人 NIDEK CO LTD 发明人 HANEBUCHI MASAAKI
分类号 A61B3/10 主分类号 A61B3/10
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