发明名称 CMOS IMAGE ELEMENT WITH IMPROVED FILL FACTOR
摘要 PROBLEM TO BE SOLVED: To provide a CMOS element with an improved fill factor. SOLUTION: The CMOS image element includes a semiconductor substrate including an element isolation region and an active region, plural gate electrodes formed at predetermined portions in the active region, and a gate electrode contact for transferring external signals to a predetermined portion in the active region, and the gate electrode contact overlaps the active region. COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP2005347742(A) 申请公布日期 2005.12.15
申请号 JP20050136434 申请日期 2005.05.09
申请人 SAMSUNG ELECTRONICS CO LTD 发明人 KIM KI-HONG;LEE SOO-CHEOL
分类号 H01L27/146;H01L27/108;H01L31/10;H04N5/335;H04N5/369;H04N5/374;(IPC1-7):H01L27/146 主分类号 H01L27/146
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