发明名称 |
CMOS IMAGE ELEMENT WITH IMPROVED FILL FACTOR |
摘要 |
PROBLEM TO BE SOLVED: To provide a CMOS element with an improved fill factor. SOLUTION: The CMOS image element includes a semiconductor substrate including an element isolation region and an active region, plural gate electrodes formed at predetermined portions in the active region, and a gate electrode contact for transferring external signals to a predetermined portion in the active region, and the gate electrode contact overlaps the active region. COPYRIGHT: (C)2006,JPO&NCIPI
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申请公布号 |
JP2005347742(A) |
申请公布日期 |
2005.12.15 |
申请号 |
JP20050136434 |
申请日期 |
2005.05.09 |
申请人 |
SAMSUNG ELECTRONICS CO LTD |
发明人 |
KIM KI-HONG;LEE SOO-CHEOL |
分类号 |
H01L27/146;H01L27/108;H01L31/10;H04N5/335;H04N5/369;H04N5/374;(IPC1-7):H01L27/146 |
主分类号 |
H01L27/146 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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