发明名称 INSULATED-GATE SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To provide an insulated-gate semiconductor device which can be controlled for gate capacitance and short-circuit current and can be suppressed in the variation in threshold voltages in the form of a CSTBT. SOLUTION: The CSTBT is formed between a p base region (104) and a semiconductor substrate (103), and contains a carrier accumulation layer (113) having a higher dopant concentration than the semiconductor substrate (103). In the CSTBT, the p base region (104) in the periphery of a gate electrode (110) works as a channel, and the carrier accumulation layer (113) satisfies a relationship of ND1<ND2, where ND1 is the dopant concentration of a carrier accumulation layer region immediately below the channel (113a), and ND2 is the dopant concentration in other part (113b) of the carrier accumulation layer region than the part immediately below the channel. COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP2005347289(A) 申请公布日期 2005.12.15
申请号 JP20040161359 申请日期 2004.05.31
申请人 MITSUBISHI ELECTRIC CORP 发明人 TOMOMATSU YOSHIFUMI;TAKAHASHI HIDEKI;TADOKORO CHIHIRO
分类号 H01L29/78;H01L21/331;H01L27/082;H01L27/102;H01L29/08;H01L29/10;H01L29/70;H01L29/739;H01L29/76;H01L29/94;H01L31/062;H01L31/11;H01L31/113;H01L31/119;(IPC1-7):H01L29/78 主分类号 H01L29/78
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