发明名称 Thin film transistor and method of fabricating the same
摘要 A thin film transistor and method of fabricating the same are provided. The thin film transistor includes: a metal catalyst layer formed on a substrate, and a first capping layer and a second capping layer pattern sequentially formed on the metal catalyst layer. The method includes: forming a first capping layer on a metal catalyst layer; forming and patterning a second capping layer on the first capping layer; forming an amorphous silicon layer on the patterned second capping layer; diffusing the metal catalyst; and crystallizing the amorphous silicon layer to form a polysilicon layer. The crystallization catalyst diffuses at a uniform low concentration to control a position of a seed formed of the catalyst such that a channel region in the polysilicon layer is close to a single crystal. Therefore, the characteristics of the thin film transistor device may be improved and uniformed.
申请公布号 US2005275019(A1) 申请公布日期 2005.12.15
申请号 US20040019459 申请日期 2004.12.23
申请人 SEO JIN-WOOK;LEE KI-YONG;YANG TAE-HOON;PARK BYOUNG-KEON 发明人 SEO JIN-WOOK;LEE KI-YONG;YANG TAE-HOON;PARK BYOUNG-KEON
分类号 H01L21/00;H01L21/20;H01L21/336;H01L27/01;H01L29/786;(IPC1-7):H01L27/01 主分类号 H01L21/00
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