发明名称 SEMICONDUCTOR DEVICE
摘要 <P>PROBLEM TO BE SOLVED: To exactly accurately a short-circuit protection by correcting a trip-level variation when performing an overcurrent protection. <P>SOLUTION: The device comprises: a semiconductor switching element (2); a current detection means (Rs) that detects the current flowing in this semiconductor switching element; an overcurrent protection means (3) that stops the operation of the semiconductor switching element when a detection signal from the current detection means exceeds a predetermined trip-level; and a characteristic correction circuit (5) that corrects the trip-level. The trip-level variation due to dispersion of the current detection means is corrected by the characteristic correction means. <P>COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP2005348429(A) 申请公布日期 2005.12.15
申请号 JP20050200556 申请日期 2005.07.08
申请人 MITSUBISHI ELECTRIC CORP 发明人 SAKATA KOJI;ARAKI TATSU
分类号 H02M7/48;H03K17/08;H03K17/56 主分类号 H02M7/48
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