发明名称 PROBE SPRING, PROBE USING THE SAME, AND CONTACT DEVICE USING THE SAME
摘要 PROBLEM TO BE SOLVED: To prevent useless increase in parasitic resistance by a probe 3, even when the probe 3 comprising probe elements 4 and 6 and a probe spring 5 is made fine. SOLUTION: The probe spring 5 is used, which has, at an intermediate part, a close-contact part 5b in which adjacent winding parts (turns) are fully brought into contact with each other. Both the end parts are composed of elastic parts 5a and 5a having the elasticity like that of ordinary coil springs. In the intermediate part 5b, an annular electric path, as well as the electric path by the probe coil spring 5 (coil-like electric path) itself, is formed by the adjacent winding parts fully brought into contact with each other, and the two electric paths are connected in parallel equivalently. COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP2005345235(A) 申请公布日期 2005.12.15
申请号 JP20040164485 申请日期 2004.06.02
申请人 TOYO DENSHI GIKEN KK 发明人 SHIBUI YUKIMORI
分类号 G01R1/067;(IPC1-7):G01R1/067 主分类号 G01R1/067
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