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发明名称
GENERATION DEVICE OF TEST-MODE ENTRY/EXIT SIGNAL AND OPERATION METHOD THERE FOR
摘要
申请公布号
KR20050117034(A)
申请公布日期
2005.12.14
申请号
KR20040042204
申请日期
2004.06.09
申请人
HYNIX SEMICONDUCTOR INC.
发明人
MOON, HYUNG WOOK
分类号
G11C11/40;G11C11/4063;G11C29/00;(IPC1-7):G11C11/406
主分类号
G11C11/40
代理机构
代理人
主权项
地址
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