发明名称 Method and apparatus for eliminating and compensating thermal transients in gas analyzer
摘要 The invention concerns a gas analyzer comprising: a measuring volume (2), a radiation source (1) for providing a beam to pass said measuring volume; a heat sink (16) for said radiation source; at least one thermal detector (3) having a hot junction within a support structure and receiving the radiation and a cold junction for reference within the same support structure and protected from said radiation; at least one optical bandpass filter (9) between said hot junction and said radiation source; and a thermal mass (11), which is formed of a material having high thermal conductance. The thermal mass has a cavity with a bottom step (34) and a rim (32), and a first length therebetween. The support structure has a frontal edge (35) and a base plate lip (33), and a second length therebetween. There is a radial gap between the thermal mass and the support structure. Press means urge said support structure in the cavity, whereupon a more efficient thermal contact is either between said frontal edge and said bottom step, or between said base plate lip and said rim. A first thermal barrier (17) is between the heat sink and the thermal mass, and a second thermal barrier (22) surrounds the thermal mass. A shield (19) formed of a material having high thermal conductance covers said second thermal barrier and is in thermal contact with said heat sink.
申请公布号 EP1605252(A2) 申请公布日期 2005.12.14
申请号 EP20050104641 申请日期 2005.05.31
申请人 GENERAL ELECTRIC COMPANY 发明人 WECKSTROEM, KURT PETER;HIETALA, MIKA;HAVERI, HEIKKI
分类号 G01N21/27;G01N21/35;G01N21/61;(IPC1-7):G01N21/35 主分类号 G01N21/27
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