发明名称 Cross-point nonvolatile memory device using binary metal oxide layer as data storage material layer and methods of fabricating the same
摘要 A cross-point nonvolatile memory device using a binary metal oxide layer as a data storage material layer includes spaced apart doped lines disposed in a substrate. Spaced apart upper electrodes cross over the doped lines such that cross points are formed where the upper electrodes overlap the doped lines. Lower electrodes are disposed at the cross points between the doped lines and the upper electrodes. A binary metal oxide layer is provided between the upper electrodes and the lower electrodes and provided as a data storage material layer. Doped regions are provided between the lower electrodes and the doped lines and form diodes together with the doped lines. The doped regions have an opposite polarity to the doped lines.
申请公布号 GB0522685(D0) 申请公布日期 2005.12.14
申请号 GB20050022685 申请日期 2005.11.07
申请人 SAMSUNG ELECTRONICS CO LTD. 发明人
分类号 G11C13/00;H01L27/24;H01L45/00 主分类号 G11C13/00
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