发明名称 Semiconductor device
摘要 A memory cell transistor and a trench capacitor are provided in a memory region, and both transistors of CMOS are provided in a logic circuit region. There are provided a bit line contact 31 and a bit line 32 extending on an inter-level dielectric 30 . In a memory cell transistor, a source diffusion layer 18 is covered with two dielectric sidewalls 25 a and 25 b in the memory cell transistor so that no silicide layer is formed on the source diffusion layer 18 . A plate contact 31 is provided to pass through the inter-level dielectric 30 and connect a shield line 33 to a plate electrode 16 b. The shield line 33 is arranged in the same interconnect layer as the bit line 32.
申请公布号 US6974987(B2) 申请公布日期 2005.12.13
申请号 US20030477924 申请日期 2003.11.18
申请人 MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD. 发明人 OGAWA HISASHI;MIYANAGA ISAO;ERIGUCHI KOJI;YAMADA TAKAYUKI;ITONAGA KAZUICHIRO;MORI YOSHIHIRO
分类号 H01L21/8242;H01L27/108;(IPC1-7):H01L27/108 主分类号 H01L21/8242
代理机构 代理人
主权项
地址