发明名称 |
Semiconductor device |
摘要 |
A memory cell transistor and a trench capacitor are provided in a memory region, and both transistors of CMOS are provided in a logic circuit region. There are provided a bit line contact 31 and a bit line 32 extending on an inter-level dielectric 30 . In a memory cell transistor, a source diffusion layer 18 is covered with two dielectric sidewalls 25 a and 25 b in the memory cell transistor so that no silicide layer is formed on the source diffusion layer 18 . A plate contact 31 is provided to pass through the inter-level dielectric 30 and connect a shield line 33 to a plate electrode 16 b. The shield line 33 is arranged in the same interconnect layer as the bit line 32.
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申请公布号 |
US6974987(B2) |
申请公布日期 |
2005.12.13 |
申请号 |
US20030477924 |
申请日期 |
2003.11.18 |
申请人 |
MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD. |
发明人 |
OGAWA HISASHI;MIYANAGA ISAO;ERIGUCHI KOJI;YAMADA TAKAYUKI;ITONAGA KAZUICHIRO;MORI YOSHIHIRO |
分类号 |
H01L21/8242;H01L27/108;(IPC1-7):H01L27/108 |
主分类号 |
H01L21/8242 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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