发明名称 Self-repairing integrated circuit and method of operating the same
摘要 An integrated circuit (IC) and methods of manufacturing and operating ICs. In one embodiment, the IC includes: (1) a plurality of interchangeable hard macrocells, (2) at least one programmable logic block (PLB), (3) a bus intercoupling said plurality and said at least one programmable logic block and (4) a self-repair program, associated with said at least one programmable logic block, that causes said PLB to test at least some of said plurality and place at least a functioning one of said plurality into an operational status.
申请公布号 US6976198(B1) 申请公布日期 2005.12.13
申请号 US20010002499 申请日期 2001.11.02
申请人 LSI LOGIC CORPORATION 发明人 VAIDA THEODORE F.
分类号 G01R31/28;G06F11/00;G11C29/00;(IPC1-7):G01R31/28 主分类号 G01R31/28
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