| 摘要 |
PROBLEM TO BE SOLVED: To provide an image examination apparatus in which a position of an optical mask can be efficiently adjusted and a visual confirmation level can be made uniform, and which can be small-sized. SOLUTION: The image examination apparatus which is capable of visually confirming sub information by overlapping an optical mask on a recording plane of a recording medium (examination target) with synthetic image information visibly recorded on the recording plane, the synthetic image information being created by embedding the sub information in an invisible state in main image information in a visible state, is provided with an adjustment means for adjusting a rotational relative position and a parallel relative position of the optical mask. COPYRIGHT: (C)2006,JPO&NCIPI
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