发明名称 Processing system and method for treating a substrate
摘要 A processing system and method for chemical oxide removal, wherein the processing system includes a process chamber having a lower chamber portion configured to chemically treat a substrate and an upper chamber portion configured to thermally treat the substrate, and a substrate lifting assembly configured to transport the substrate between the lower chamber portion and the upper chamber portion. The lower chamber portion includes a chemical treatment environment that provides a temperature controlled substrate holder for supporting the substrate for chemical treatment. The substrate is exposed to a gaseous chemistry, such as HF/NH<SUB>3</SUB>, under controlled conditions including surface temperature and gas pressure. The upper chamber portion includes a thermal treatment environment that provides a heating assembly configured to elevate the temperature of the substrate.
申请公布号 US2005269030(A1) 申请公布日期 2005.12.08
申请号 US20040860149 申请日期 2004.06.04
申请人 TOKYO ELECTRON LIMITED 发明人 KENT MARTIN;LAFLAMME ARTHUR H.JR.;WALLACE JAY;HAMELIN THOMAS
分类号 H01L21/00;(IPC1-7):C23F1/00 主分类号 H01L21/00
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