发明名称 |
ALIGNMENT DEVICE, EXPOSURE APPARATUS, ALIGNMENT METHOD AND EXPOSURE METHOD, AND DEVICE MANUFACTURING METHOD AND (TOOL) RETICLE FOR CALIBRATION |
摘要 |
<P>PROBLEM TO BE SOLVED: To make an accurate alignment of an object. <P>SOLUTION: A tool reticle is loaded onto a pre-alignment stage 110, and positional information of a mark on the tool reticle is detected by a pre-alignment system 45. Then, the tool reticle is loaded onto a reticle stage RST via an exchange arm 120, and positional information of the reticle is detected by a reticle alignment system 22. From these detection results, a deviation is calculated between the pre-alignment detection system and the RA coordinate system. When actually making a pre-alignment of the reticle on the reticle pre-alignment stage 110, the calculated deviation is taken into consideration. <P>COPYRIGHT: (C)2006,JPO&NCIPI |
申请公布号 |
JP2005340315(A) |
申请公布日期 |
2005.12.08 |
申请号 |
JP20040154114 |
申请日期 |
2004.05.25 |
申请人 |
NIKON CORP |
发明人 |
SUGIHARA TARO;MIMURA MASABUMI |
分类号 |
G03F7/20;H01L21/027;H01L21/68 |
主分类号 |
G03F7/20 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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