| 摘要 |
<P>PROBLEM TO BE SOLVED: To provide a semiconductor device that has a long lifetime even if it is used under high-temperature and high-current-density environment, such as an HTOL test, and to provide an electronic device using the semiconductor device. <P>SOLUTION: In the semiconductor device, a substrate or a lead frame, and a semiconductor element are electrically joined by a gold wire, and a reverse bias current flows when the semiconductor device is idling or is at halt. The electronic device uses the semiconductor device. <P>COPYRIGHT: (C)2006,JPO&NCIPI |
