发明名称 WAVELENGTH DETERMINATION DEVICE, WAVELENGTH DETERMINATION METHOD, SEMICONDUCTOR LASER CONTROL DEVICE, AND SEMICONDUCTOR LASER CONTROL METHOD
摘要 PROBLEM TO BE SOLVED: To detect/determine a wavelength of a laser beam emitted from an external-resonator-type semiconductor laser using a simple structure, and furthermore suppress injection of laser light in an disabled mode. SOLUTION: The device has a reflection element that receives at least part of a laser beam emitted from an external-resonator-type semiconductor laser, and emits reflected light, causing different light intensity distribution corresponding to a striped image; a photodetector that detects light intensity of the reflected light from the reflection element at least two light receiving positions; and a determination circuit that obtains a differential value between detected signals in the at least two light receiving positions, and determines a wavelength of the laser beam based on the differential value, wherein the at least two light receiving positions are disposed in a direction along which the stripes are aligned. COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP2005340783(A) 申请公布日期 2005.12.08
申请号 JP20050115414 申请日期 2005.04.13
申请人 SONY CORP 发明人 TANAKA FUJI
分类号 H01S5/0687;G01J9/02;H01S3/13;H01S5/0683;H01S5/14;(IPC1-7):H01S5/068 主分类号 H01S5/0687
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