发明名称 INFRARED IMAGING APPARATUS HAVING SENSIBILITY CORRECTION MECHANISM OF INFRARED DETECTOR
摘要 PROBLEM TO BE SOLVED: To achieve a compact and lightweight sensitivity correction mechanism of a simplified constitution in an infrared imaging apparatus having a sensitivity correction mechanism of an infrared detector. SOLUTION: The infrared imaging apparatus is provided with infrared detecting elements 12 and 13 corresponding to a plurality of optical systems. A rotating base plate 11 is arranged at a position which intersects with an infrared incident optical path of each optical system. The rotating base plate 11 is provided with a plurality of through holes for passing infrared incident light of each optical system and temperature reference plates 16, 32, 17, and 31 for correcting the sensitivity of the infrared detecting elements. The rotating base plate 11 is rotated to arrange the through holes at positions which intersect with the infrared incident optical path of each optical system when infrared images are taken and arrange the temperature reference plates at positions which intersect with the infrared incident optical path of each optical system in such a way as to oppose the temperature reference plates to the infrared detecting elements when the sensitivity of the infrared detecting elements is corrected. Sensitivity correction data on the side of low temperatures (or on the side of high temperatures) is measured from the infrared detecting elements 12 and 13, and temperature sensitivity correction data on the opposite side is measured by rotating the rotating base plate 11 by 180 degrees. COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP2005337772(A) 申请公布日期 2005.12.08
申请号 JP20040154166 申请日期 2004.05.25
申请人 FUJITSU LTD 发明人 MARUYAMA TSUTOMU
分类号 G01J1/42;G01J1/02;G01J5/48;H04N5/33;(IPC1-7):G01J1/42 主分类号 G01J1/42
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