发明名称 |
Failure analyzing system and method for displaying the failure |
摘要 |
A failure analyzing system for displaying a position of a failure in a semiconductor device, includes: a circuit position memory for storing physical positions of respective circuits included in the semiconductor device; a defective information acquisition unit for acquiring information on a defective circuit included in the semiconductor device; and a display for displaying the defective circuit on a layout of the semiconductor device with a color that is different between the physical positions.
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申请公布号 |
US2005270165(A1) |
申请公布日期 |
2005.12.08 |
申请号 |
US20040869821 |
申请日期 |
2004.06.16 |
申请人 |
ADVANTEST CORPORATION |
发明人 |
NAGANO KATSUHITO;OGAWA SHUICHIRO |
分类号 |
G01R31/28;G05B23/02;G08B21/00;H01L21/66;(IPC1-7):G08B21/00 |
主分类号 |
G01R31/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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