发明名称 Integrated circuit wafer packaging system and method
摘要 A packaging system, hereinafter referred to as the Critical Packaging System, relates to critical issues that associate with sensitive articles such as IC wafers before, during and after shipment phases. The system employs a choice of two or more specialty designed containers, and any one selected design having choices of two or more methods by which to avoid, reduce and/or eliminate wafer damage from breakage, scratches and/or corrosion during shipment phases. For the purpose of maximizing product yield during packaging phases a special apparatus is used to insert wafers within containers without scratch damage. The following programs are used in packaging: (1) Quality Assurance/Certification, (2) Critical Factor Monitoring, and (3) a Recycle and Refurbish Program. These programs are specifically designed to achieve new levels of product yields, reduce product cost, and landfill impact.
申请公布号 US2005269241(A1) 申请公布日期 2005.12.08
申请号 US20040859720 申请日期 2004.06.03
申请人 BROOKS RAY G;BROOKS TIMOTHY W 发明人 BROOKS RAY G.;BROOKS TIMOTHY W.
分类号 B65D57/00;B65D21/02;B65D81/07;B65D81/26;B65D85/86;B65G49/07;H01L21/673;H01L21/677;H01L21/68;(IPC1-7):B65D85/30 主分类号 B65D57/00
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