发明名称 INSPECTION METHOD OF SHEET WITH IC TAG
摘要 <P>PROBLEM TO BE SOLVED: To execute inspection of electric characteristic of an IC tag in a state of a sheet with IC tag. <P>SOLUTION: The sheet 1 with IC tag 1 comprises a nonconductive sheet 21, a pair of conductors 22 provided on the nonconductive sheet 21 and extending in a strip shape, and a number of IC chips 20 provided on the pair of conductors 22. The IC tag 10 is composed of a pair of extended electrodes 9 and an IC chip 20. The inspection method of the sheet with IC tag 1 comprises a process for preparing the sheet with IC tag 1; a process for cutting the conductors 22 of the sheet with IC tag 1 for every IC chip 20 in the feeding direction and successively forming the IC tag 10 composed of the pair of extended electrodes 9 and the IC chip 20 on the nonconductive sheet 21 extending in the strip form;and a process for inspecting the electric characteristic of each IC tag 10. <P>COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP2005339501(A) 申请公布日期 2005.12.08
申请号 JP20050025208 申请日期 2005.02.01
申请人 DAINIPPON PRINTING CO LTD 发明人 SAKATA HIDETO;SUGURO KEIJI
分类号 B42D15/10;G01R31/26;G06K19/077 主分类号 B42D15/10
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