发明名称 |
INSPECTION METHOD OF SHEET WITH IC TAG |
摘要 |
<P>PROBLEM TO BE SOLVED: To execute inspection of electric characteristic of an IC tag in a state of a sheet with IC tag. <P>SOLUTION: The sheet 1 with IC tag 1 comprises a nonconductive sheet 21, a pair of conductors 22 provided on the nonconductive sheet 21 and extending in a strip shape, and a number of IC chips 20 provided on the pair of conductors 22. The IC tag 10 is composed of a pair of extended electrodes 9 and an IC chip 20. The inspection method of the sheet with IC tag 1 comprises a process for preparing the sheet with IC tag 1; a process for cutting the conductors 22 of the sheet with IC tag 1 for every IC chip 20 in the feeding direction and successively forming the IC tag 10 composed of the pair of extended electrodes 9 and the IC chip 20 on the nonconductive sheet 21 extending in the strip form;and a process for inspecting the electric characteristic of each IC tag 10. <P>COPYRIGHT: (C)2006,JPO&NCIPI |
申请公布号 |
JP2005339501(A) |
申请公布日期 |
2005.12.08 |
申请号 |
JP20050025208 |
申请日期 |
2005.02.01 |
申请人 |
DAINIPPON PRINTING CO LTD |
发明人 |
SAKATA HIDETO;SUGURO KEIJI |
分类号 |
B42D15/10;G01R31/26;G06K19/077 |
主分类号 |
B42D15/10 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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