发明名称 INSPECTION SUBSTRATE FOR ACTIVE MATRIX TYPE LIQUID CRYSTAL DISPLAY
摘要 PROBLEM TO BE SOLVED: To provide an inspection substrate for an active matrix type liquid crystal display that facilitates defect detection of various modes by inspection using an array tester. SOLUTION: The inspection substrate for the active matrix type liquid crystal display has a plurality of scanning lines 11 and a plurality of signal lines 13 which are arranged on a main surface while crossing each other, a plurality of storage capacity lines 15 which are arranged in parallel to the scanning lines 11, a storage capacity element 21 which includes some of the storage capacity lines 15 as one electrode, a storage capacity upper electrode 17 which is formed in the same layer with the signal lines 13 and electrically connected to the storage capacity element 21, a switching element 23 which is arranged at each intersection of a signal line 13 and a scanning line 11 and electrically connected to the storage capacity element 21, and a dummy wire 25a and a dummy wire 25b which are formed by using at least one of two kinds of metal constituting the switching element 23 and electrically connected to one of the signal line 13, storage capacity line 15, and storage capacity upper electrode 17. COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP2005338540(A) 申请公布日期 2005.12.08
申请号 JP20040158796 申请日期 2004.05.28
申请人 TOSHIBA MATSUSHITA DISPLAY TECHNOLOGY CO LTD 发明人 IIZUKA TETSUYA;YAMAMOTO MITSUHIRO;TABATA HIROSHI
分类号 G01R31/00;G02F1/1368;H01L27/00;H01L29/786;(IPC1-7):G02F1/136 主分类号 G01R31/00
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