发明名称 |
A MEANS FOR CALIBRATING A MICROSCOPE, A METHOD OF PREPARING THE MEANS AND A METHOD OF CALIBRATING A MICROSCOPE |
摘要 |
<p>A means or artefact for calibrating the height/depth or Z axis of a microscope, such as a confocal microscope, an interference microscope or a Scanning Electron Microscope. The artefact comprises a number of tapering or pie-shaped, parallel surfaces each extending from a central axis, whereby all surfaces and heights are visible independently of the magnification of the microscope. Thus, the full height range may be calibrated and the linearity thereof checked independently of the magnification.</p> |
申请公布号 |
WO2005116716(A1) |
申请公布日期 |
2005.12.08 |
申请号 |
WO2005DK00346 |
申请日期 |
2005.05.25 |
申请人 |
DANMARKS TEKNISKE UNIVERSITET;HANSEN, HANS NOERGAARD;DE CHIFFRE, LEONARDO;HORSEWELL, ANDY;SOBIECKI, RENE;BARIANI, PAOLO |
发明人 |
HANSEN, HANS NOERGAARD;DE CHIFFRE, LEONARDO;HORSEWELL, ANDY;SOBIECKI, RENE;BARIANI, PAOLO |
分类号 |
G02B21/00;(IPC1-7):G02B21/00 |
主分类号 |
G02B21/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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