发明名称 Charged particle beam gun
摘要 An electron gun (1) includes an emitter (2), a tubular support (3) and an adaptor (4) for receiving the emitter. The adaptor includes a tapered plugging surface (7) and the tubular support includes a correspondingly tapered seating surface (9) for receiving the plugging surface. The plugging surface and seating surface have conical profiles which help to position the adaptor concentrically with the support. An extractor electrode (5) may be seated in another adaptor (6) which itself is seated in the support (3) by a similar arrangement of correspondingly tapered surfaces (8),(10). The gun may be an electron gun or an ion gun, e.g. for electron beam lithography. The arrangement facilitates proper alignment and spacing of the emitter (2) and the extractor electrode (5).
申请公布号 GB2414856(A) 申请公布日期 2005.12.07
申请号 GB20040012426 申请日期 2004.06.03
申请人 * NANOBEAM LIMITED 发明人 TAO * ZHANG
分类号 H01J1/16;H01J1/18;H01J3/02;H01J37/06;H01J37/065;H01J37/067 主分类号 H01J1/16
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