发明名称 Polishing method
摘要 <p>There are provided a polishing apparatus and a polishing method capable of performing polishing a work (such as a wafer) with high efficiency and high precision, a novel work holding plate effectively holding a work and an adhering method for a work capable of adhering the work on the work holding plate with high precision. The polishing apparatus comprises: a polishing table(29); and a work holding plate(38), wherein a work held on the work holding plate(38) is polished supplying a polishing agent solution(41) in the apparatus, and in polishing action, an amount of deformation of the polishing table(29) in a direction normal to an upper surface thereof with respect to the upper surface thereof and/or an amount of deformation of the work holding plate(38) in a direction normal to a work holding surface thereof is restricted to 100 mu m or less by forming the polishing table(29) in one-piece, contriving flow paths of cooling water and others. <IMAGE></p>
申请公布号 EP1602444(A2) 申请公布日期 2005.12.07
申请号 EP20050018524 申请日期 2001.01.29
申请人 SHIN-ETSU HANDOTAI COMPANY LIMITED 发明人 KIUCHI, ETSUO;HAYASHI, TOSHIYUKI
分类号 B24B37/015;B24B37/04;B24B37/12;B24B37/14;B24B37/30;B24B41/04;B24B41/06;B24B49/14;B24B55/02;B24B57/02;(IPC1-7):B24B37/04;B24B37/00 主分类号 B24B37/015
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